Research Output | Dar Al-hikmah Library | IIUM Only
Neutron radiation testing was performed on silicon and GaAs diodes to investigate changes in the device parameters after neutron exposure. Californium-252 source was used to irradiate these diodes up to total dose of 1117.87mSv. The effects of nuclear radiation on the forward and reverse current-voltage (I-V) characteristics of Silicon and GaAs dio